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PubMed Central, Figure 9.: Sensors (Basel). 2014 Jun; 14(6): 11225–11244. Published online 2014 Jun 24. doi:  10.3390/s140611225
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Figure 9.

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XPS Spectrum showing the formation of a specific oxide of Ge—GeO2 with Carbon and trace amounts of Si (from the flow cell)—(C1s at 284.6 eV for C-C, 286.4 eV for C-O, 288.6 eV for O=C-O; O1s peak at 531.9 eV for GeO2; Ge3d at 32.7 eV for GeO2; Si2p at 102.2 eV).

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